← usb-c-pd-trigger

Circuit review & bench-test guide

Selectable USB-C PD trigger

Design-stage — board not yet fabricated

Document purpose#

This document explains the usb-c-pd-trigger prototype at component level and turns the design evidence into a practical manual-review and bench-test plan. It is based on the implemented schematic, PCB, manufacturing BOM, selector harness specification, calculations, and QA evidence in this directory.

The board is still a prototype. Repository QA records 41 PASS, 5 CONDITIONAL, 18 OPEN, and 0 FAIL results. In particular, there is no recorded first-article bench result. Calculated and simulated values below are targets to verify, not proof that an assembled board is safe or conforming.

1. What the board does#

The board is a power-only USB Type-C Power Delivery sink. A five-position, two-pole external selector chooses a 5 V, 9 V, 12 V, 15 V, or 20 V ceiling. The HUSB238A negotiates autonomously, requests up to 3 A, and turns on a contract-authoritative P-channel MOSFET. A TPS259470A eFuse then applies a controlled ramp and adds current limiting, overload timing, overvoltage lockout, reverse-current blocking, and fault reporting.

It does not support USB data, PPS, AVS, EPR, or 5 A operation. The green LED means protected output voltage is present; it does not prove which PD voltage was negotiated or that 3 A is available.

Functional block diagram#

                          CC1 / CC2
USB-C J1 ─────────────────────┐
                             v
VBUS_RAW ───────────────> HUSB238A U1 <── two-pole selector J2
   │                         │ GATE          VSET + EN_N interlock
   ├── D1 TVS2200            v
   ├── D2 negative clamp   Q1 40 V P-MOSFET
   └── C1 input bypass        │
                              v
                           PD_VBUS
                              │
                              v
                       TPS259470A U2
                       eFuse / RCB / OVP
                              │
                              v
                            VOUT ──> J4 main output
                              ├────> J5 light-load header
                              ├────> J6 status/sense
                              └────> green output LED

2. Safety and scope boundaries#

3. Power and control sequence#

  1. With no cable, R6 holds Q1's gate at its source, so Q1 is off. U2 has no input and VOUT is off.
  2. The selector connects SNK_VSET to one programmed resistance and grounds HUSB_EN_N only at a valid detent. Between detents EN_N opens.
  3. The source detects the HUSB238A sink on CC1 or CC2 and initially supplies default USB-C VBUS.
  4. U1 reads R3 as the 3 A request and the selected VSET resistance as the voltage ceiling, then negotiates the best acceptable fixed PDO.
  5. After a valid contract, U1's GATE output pulls PMOS_GATE low through R5. Q1 connects VBUS_RAW to PD_VBUS; D3 limits excessive negative VGS.
  6. U2 checks enable/UVLO and the R14/R15 OVLO divider. If valid, it ramps VOUT according to C3, limits current according to R17, and times overloads with C4.
  7. C6 charges, D6 lights through R20, and the load can use J4. The sense divider R18/R19 reports a scaled VOUT on J6/TP4.

Why there are two series switches#

Q1 is controlled by the PD controller and is therefore the switch that says a contract has been accepted. U2 is a separate protection boundary. Removing Q1 would let the eFuse pass the source's default VBUS without contract authority; removing U2 would discard the precise inrush, overload, OVLO, fault, and always-on reverse-blocking functions. Their combined voltage drop and heating must be measured at 3 A.

4. Selector and external interfaces#

The intended external switch is a Grayhill 56A36-01-2-05N DP5T non-shorting selector wired to J2. Both commons must be open between detents.

PositionJ2 VSET pathJ2 EN_N pathProgram resistorRequested ceiling
5 Vpin 1 to pin 3pin 2 to pin 4/GNDR7 = 0 Ω5 V
9 Vpin 1 to pin 5pin 2 to pin 6/GNDR8 = 3.00 kΩ9 V
12 Vpin 1 to pin 7pin 2 to pin 8/GNDR9 = 6.04 kΩ12 V
15 Vpin 1 to pin 9pin 2 to pin 10/GNDR10 = 11.0 kΩ15 V
20 Vpin 1 to pin 11pin 2 to pin 12/GNDR11 = 19.1 kΩ20 V

An open VSET input means “highest voltage” for this controller, so the second pole is essential: it disables U1 between positions instead of allowing an open contact to become an accidental high-voltage request.

ReferencePins/signalsIntended use
J1USB-C VBUS, GND, CC1, CC2PD source connection; data/SBU unused
J212-pin VSET/EN_N harnessProduction selector connection
J3same selector mapDNP development header only
J41 VOUT, 2 GNDMain 3 A Molex Micro-Fit output
J5VOUT, VOUT, GND, GNDDNP light-load header, ≤0.5 A
J6VOUT_SENSE, PD_FAULT, EFUSE_FLT_N, GNDDNP status header
Test pointNetExpected role
TP1VBUS_RAWNegotiated source voltage before Q1
TP2PD_VBUSVoltage after Q1 and before U2
TP3VOUTProtected output
TP4VOUT_SENSE0–about 3.2 V scaled output
TP5 / TP6CC1 / CC2High-impedance PD probing only
TP7GNDProbe reference
TP8SNK_VSETSelected programming voltage/resistance node
TP9HUSB_EN_NLow only at a valid selector detent
TP10PMOS_GATEQ1 gate-drive observation

5. Component-by-component review#

5.1 Contract and main power path#

Ref.Part / datasheet summaryFunction and why neededIf absent/openIf shorted, wrong, or misassembled
J1GCT USB4105-GF-A-120, USB-C receptacleReversible source connection; parallels VBUS/GND contacts and keeps CC1/CC2 separateNo power; an open CC pad may make only one orientation fail; partial VBUS/GND soldering can overheat at loadVBUS–GND trips the source; CC–VBUS can destroy U1; CC1–CC2 breaks orientation behavior
U1Hynetek HUSB238A-BB001, autonomous PD sink controllerDetects source, negotiates the fixed PDO, interprets VSET/ISET, and authorizes Q1Standards-compliant PD negotiation and contract-controlled turn-on are lostWrong variant/strap can request the wrong power; damaged GATE may leave Q1 permanently off or on
Q1Diodes Inc. DMP4015SSS-13, −40 V P-channel MOSFETContract-authoritative high-side switch between raw and protected busesPD_VBUS stays offD-S short bypasses contract isolation; excessive RDS(on) causes drop/heating; reversed assembly changes body-diode behavior
U2TI TPS259470ARPWR, 2.7–23 V, 5.5 A-class, 28 mΩ typical eFuseAdds soft start, adjustable current limit/timer, OVLO, overload/short protection, thermal shutdown, fault output, and true reverse blockingNo protected outputIN–OUT short bypasses protection; wrong suffix changes response; poor QFN soldering raises resistance or defeats thermal removal
J4Molex 43650-0210; mating 43645-0200Locking, polarized primary output appropriate for the intended current when correctly crimpedNo useful main outputReversed harness can damage the load; weak crimp/contact causes heat and voltage loss

5.2 Transient, reverse, and gate protection#

Ref.Value / partPurposeWhat is lost if omittedImportant failure/review point
D1TI TVS2200DRVR, 22 V standoff flat-clamp TVSShunts positive VBUS surge/ESD energy near J1Downstream parts see larger positive transientsTI specifies up to 28.4 V clamp at 40 A while U2 IN absolute max is 28 V: no guaranteed 0.4 V margin at that cited corner
D2Diodes Inc. B340A-13-F, 3 A/40 V SchottkyClamps negative VBUS excursions to GNDNegative events can pull U1/Q1 input below groundA short becomes VBUS-to-GND; polarity and SMA solder fillets matter
D3Nexperia BZT52H-C10, 10 V zenerLimits Q1 source-to-gate voltage at 15/20 V contractsQ1 may exceed its VGS ratingShort holds gate at source and Q1 off; wrong polarity provides no intended clamp
D5Nexperia PMEG4010EH, 40 V SchottkyClamps negative VOUT events before U2 is overstressedNegative externally induced output transients are less controlledShort kills VOUT; it is not a substitute for safe reverse-injection testing
R510 kΩLimits/isolates U1 GATE drive into Q1 gate and zener networkGate transients and controller stress increaseOpen keeps Q1 off; too large slows switching excessively
R6100 kΩPulls Q1 gate to source so default state is offGate can float and Q1 may partially turn onShort is effectively gate-to-source, permanently off

5.3 U1 programming, indications, and bypass#

Refs.ValueFunctionIf omitted or wrong
R1, R2900 kΩ eachRequired DEBUG_N and EN_HVDCP biasing to GNDUndefined or wrong controller mode
R321.0 kΩ, 1%Programs 3 A SNK_ISETOpen/wrong value changes the requested-current policy; it does not make a cable/source capable of 3 A
R7–R110 Ω, 3.00 kΩ, 6.04 kΩ, 11.0 kΩ, 19.1 kΩFive VSET codesOpen can mean highest voltage; wrong tolerance/value selects the wrong ceiling
C12.2 µF, 50 V X7RLocal raw-VBUS energy and high-frequency bypassMore supply bounce and susceptibility during negotiation/switching
C21 µF, 10 V X7RHUSB238A VDD decouplingController resets, unstable negotiation, or EMI sensitivity
R4 + D42.2 kΩ + red LEDVisual indication from PD_FAULTNo local visual status; wrong LED polarity makes it dark

5.4 eFuse programming and output network#

Refs.Value / calculationFunctionIf omitted or wrong
R12470 kΩ, PD_VBUS to EN/UVLOEnables U2 from the input; U2 internal UV protection remains activeOpen holds output off; short removes intended input impedance and can over-stress the pin
R14 / R151.74 MΩ / 100 kΩPrograms OVLO; calculated rising trip 21.36–22.93 V, 22.08 V nominalOpen/short can disable output or remove the intended 20 V overvoltage guard
R17976 Ω, 1%Programs current limit: 3.013–3.757 A, 3.421 A nominalOpen/wrong value changes both protection and current-monitor interpretation
C3330 pF C0GPrograms about 6.06 V/ms VOUT slew; about 3.3 ms to 20 VOpen causes fastest/uncontrolled ramp; too large slows startup and can interact with source timing
C42.2 nF C0GPrograms overload blanking: 1.08–3.35 ms, 1.85 ms nominalOpen/minimum timer trips peaks quickly; too large permits longer fault energy
C51 µF, 50 V X7RLocal U2 input bypass after Q1More ringing and less local transient current
C610 µF, 50 V X7RMinimum local output reservoir and loop/load decouplingLarger droop/ringing; startup behavior changes; arbitrary extra capacitance raises inrush
R18 / R19187 kΩ / 33 kΩScales VOUT for measurement; worst calculated 3.204 V at 21 VOpen/short can report zero, full VOUT, or load the output; do not feed a lower-voltage ADC without its own tolerance review
R20 + D64.7 kΩ + green LEDIndicates VOUT presenceNo visual output indication; it never proves the selected PDO or current entitlement

5.5 Mechanical, shield, and option parts#

Refs.Part / valuePurpose and population rule
J2JST SM12B-SRSS-TBRequired selector harness interface; verify latch, pin numbering, and both poles
J3, J5, J6Development/status headersDNP in core SMT build; populate only for the intended test configuration
R22 + C81 MΩ + 4.7 nF C0GHigh-impedance/DC bleed plus AC coupling from USB shell to board ground; omitting leaves the shell floating, shorting creates a hard chassis bond
R230 Ω shield linkDNP alternative to R22/C8; never populate casually because it changes grounding/EMC behavior
R16, R21, D747 kΩ, 10 kΩ, red LEDMandatory DNP eFuse-fault LED option. U2 FLT is recommended for at most 5 V and has 6.5 V absolute max; pulling it to VOUT could expose it to 20 V

6. Datasheet summary and design interpretation#

DeviceKey manufacturer facts used hereBoard-specific interpretation
HUSB238AAutonomous USB PD sink; fixed-voltage request selection via external VSET resistance; current request via ISET; GATE controls an external PMOSVerify every selector code against an actual analyzer. The design's external EN_N interlock is required because open VSET selects the highest option
TPS259470A2.7–23 V operating input, 28 V absolute maximum, 28.3 mΩ typical RON, adjustable 0.5–6 A limit, dV/dt, ITIMER, OVLO, fast short response, thermal shutdown, FLT, and always-on reverse blockingThe 20 V rail fits the operating range. The selected components calculate to ~3.42 A limit and ~3.3 ms 20 V rise. Validate hot RON, retry behavior, and FLT voltage
TVS220022 V standoff, 24.6 V minimum breakdown, maximum 28.4 V clamp at 40 A 8/20 µs, 40 A surge capability, 105 pF typicalExcellent normal 20 V compatibility, but the maximum clamp exceeds U2's 28 V absolute maximum by 0.4 V at the cited extreme. Treat surge immunity as open
DMP4015SSS−40 V P-MOSFET, low resistance with adequate negative gate driveAt the 5 V contract the drive is only about −4.5 V; repository estimate uses ≤15 mΩ and ≤0.135 W at 3 A. Measure rather than extrapolate
B340A / PMEG4010EH / BZT52H-C10Schottky negative clamps and 10 V gate zenerThey manage polarity/transient edges but do not make destructive fault injection automatically safe

Official references: HUSB238A product page, TPS25947 datasheet/product page, TVS2200 datasheet/product page, and DMP4015SSS product page. Check the latest revision and exact orderable suffix before procurement.

7. Expected values before bench testing#

QuantityDesign target / calculated rangeWhat to measure
Requested PDO ceiling5, 9, 12, 15, or 20 VSource analyzer contract and TP1
Current request3 APD request messages; source/cable may offer less
OVLO rising trip21.36–22.93 V; 22.08 V nominalControlled supply sweep on protected-path subtest
Current limit3.013–3.757 A; 3.421 A nominalElectronic-load ramp and waveform
Overload blanking1.08–3.35 ms; 1.85 ms nominalCurrent/VOUT/FLT scope capture
VOUT slewabout 6.06 V/msTP2 and TP3 differential timing
20 V rise timeabout 3.3 ms10–90% and full-ramp captures
Fitted-cap inrushabout 61 mA for the modeled rampSource current capture; actual load capacitance changes this
Sense at 21 V worst corner≤3.204 V calculatedTP4 with calibrated DMM
U2 loss at 3 A0.254 W typical, 0.405 W maximum estimateThermal camera/thermocouple and input-output drop
Q1 loss at 3 A≤0.135 W estimateQ1 drop and case/board temperature
Combined switch loss≤0.540 W estimate60-minute thermal soak, worst ambient/enclosure

8. Manual schematic and assembly review checklist#

9. Ordered bench-test procedure#

Stop at the first abnormal result. Save raw captures with board serial number, source/cable identity, equipment ID, calibration date, ambient, and operator.

A. Unpowered inspection and resistance tests#

  1. Disconnect USB, load, selector, and oscilloscope.
  2. Inspect the assembly under magnification; complete the checklist above.
  3. Measure VBUS_RAW-to-GND, PD_VBUS-to-GND, and VOUT-to-GND resistance in both meter polarities. Investigate a hard short before power.
  4. Confirm no DC short from shell to GND; R22 should read about 1 MΩ after C8 settles when R23 is DNP.
  5. Verify J2 selector continuity and break-before-make action with an ohmmeter.

B. First attach, no load#

  1. Set selector to 5 V. Use a current-limited PD source/analyzer and no load.
  2. Attach in one cable orientation. Capture CC, VBUS_RAW, PD_VBUS, VOUT, PMOS_GATE, and negotiated request as equipment permits.
  3. Expect TP1 near 5 V, TP2 only after contract/GATE action, and a controlled TP3 ramp. Confirm the green LED and sense ratio.
  4. Repeat after flipping the USB-C plug.
  5. Repeat at 9, 12, 15, and 20 V. Confirm the analyzer's actual contract; do not infer voltage from selector position or LED state.

C. Selector safety and source mismatch#

  1. With no load, rotate slowly through every detent while monitoring TP8, TP9, TP10, TP1, and TP3. EN_N must release and the path must disconnect between positions before a new request takes effect.
  2. Try sources that lack selected PDOs and sources/cables that cannot provide 3 A. Record whether U1 selects a lower acceptable PDO or refuses the path, and verify the result is safe for the intended downstream load.
  3. Do not proceed to loaded hot rotation until unloaded behavior is repeatable.

D. Load regulation and thermal soak#

  1. Use J4, short heavy leads, remote DMM sense at J4, and an electronic load.
  2. At each supported voltage, sweep 0 A, 0.1 A, 0.5 A, 1 A, 2 A, and 3 A while respecting the source/cable contract.
  3. Record TP1, TP2, TP3, J4 voltage, input current, output current, Q1/U2/J1/J4 temperature, and FLT/PD_FAULT state.
  4. Run 60 minutes at 3 A at worst intended ambient. Compare measured switch loss to the 0.540 W combined estimate and check connector/copper hot spots.

E. Dynamic, overload, and reverse tests#

  1. Apply controlled load steps and capture VOUT deviation/recovery, source current, and fault outputs with bandwidth limits stated.
  2. Increase load slowly through current limit, then test a controlled hard short using a safe fixture. Capture current limit, ITIMER, shutdown/retry, and temperature. Do not repeatedly short a hot board.
  3. Repeat with representative added output capacitance; verify inrush and PD source stability rather than assuming the 61 mA fitted-cap estimate applies.
  4. With USB absent, inject a current-limited voltage at VOUT below, equal to, and slightly above the intended rail as allowed by the test plan. Confirm U2 reverse blocking and that TP1/TP2 are not energized unexpectedly.

F. Release-only tests#

Perform source/cable interoperability, brownout/attach endurance, ESD, surge, EMC, product safety, and environmental compliance under controlled lab plans. The TVS2200/U2 clamp-margin question must be explicitly resolved before a surge claim or production release.

10. Troubleshooting map#

SymptomFirst measurementsLikely areas
No VBUS in either orientationCC1/CC2, source log, J1 solderJ1, U1 power/CC, source/cable
One orientation failsCC1 versus CC2 continuityJ1 CC pad/open trace/U1 pin
TP1 correct, TP2 zeroEN_N, VSET, GATE, PMOS_GATEselector harness, U1, R5/R6/D3, Q1
TP2 correct, TP3 zeroEN_UVLO, OVLO, FLT, dV/dtU2, R12/R14/R15, C3, output short
Wrong negotiated voltageanalyzer request, TP8 resistanceR7–R11, J2 pinout, selector contact
VOUT oscillates/retriescurrent waveform, FLT, temperatureoverload, C4, source collapse, U2 thermal
Excessive drop at 3 ATP1→TP2 and TP2→TP3 separatelyQ1 versus U2, J1/J4/cable, solder joints
Sense voltage wrongTP3 and TP4, R18/R19divider value/solder, unexpected ADC load
Red eFuse LED populatedinspect R16/R21/D7unsafe assembly variant; remove and review

11. Bench record template#

FieldRecord
Board revision / serial
Assembly variant and DNP audit
PD source, cable, analyzer IDs
DMM/scope/load/thermal equipment and calibration
Ambient, airflow, enclosure state
Selector continuity/interlock result
Contract result, both orientations, all positions
No-load and 0–3 A regulation results
Inrush/load-step/overload captures
Reverse-blocking result
60-minute thermal result
Deviations, photos, raw-file paths
Reviewer / date / disposition

12. Review conclusion#

The architecture is coherent: the HUSB238A owns the PD contract and Q1, while the TPS259470A provides a second, independent protection layer. The selector's two-pole interlock is not optional convenience—it prevents open VSET from becoming a high-voltage request. The principal release risks are unverified first-article behavior, 3 A thermal performance, hot selection and source interoperability, reverse/fault behavior, connector assembly quality, and the TVS2200 maximum-clamp versus U2 absolute-maximum mismatch.